Douglas D. Coolbaugh

Publication Activity (10 Years)

Years Active: 2003-2015
Publications (10 Years): 1

Top Topics

Spectrum Analysis

Semiconductor Manufacturing

Top Venues

Publications

Erman Timurdogan, Zhan Su, Krishna T. Settaluri, Sen Lin, Sajjad Moazeni, Chen Sun, Gerald Leake, Douglas D. Coolbaugh, Benjamin R. Moss, Michele Moresco, Vladimir Stojanovic, Michael R. Watts
An ultra low power 3D integrated intra-chip silicon electronic-photonic link. OFC (2015)
Zhan Su, Ehsan S. Hosseini, Erman Timurdogan, Jie Sun, Gerald Leake, Douglas D. Coolbaugh, Michael R. Watts
Reduced wafer-scale frequency variation in adiabatic microring resonators. OFC (2014)
James S. Dunn, David L. Harame, Alvin J. Joseph, Stephen A. St. Onge, Natalie B. Feilchenfeld, Louis D. Lanzerotti, Bradley A. Orner, Ephrem G. Gebreselasie, Jeffrey B. Johnson, Douglas D. Coolbaugh, Rick Rassel, Marwan Khater
SiGe BiCMOS Trends - Today and Tomorrow. CICC (2006)
Alvin J. Joseph, David L. Harame, Basanth Jagannathan, Douglas D. Coolbaugh, David C. Ahlgren, John Magerlein, Louis D. Lanzerotti, Natalie B. Feilchenfeld, Stephen A. St. Onge, James S. Dunn, Edward J. Nowak
Status and Direction of Communication Technologies - SiGe BiCMOS and RFCMOS. Proc. IEEE 93 (9) (2005)
John Pekarik, David R. Greenberg, Basanth Jagannathan, Robert A. Groves, J. R. Jones, Raminderpal Singh, Anil Chinthakindi, Xudong Wang, Matthew J. Breitwisch, Douglas D. Coolbaugh, Peter E. Cottrell, John E. Florkey, Greg G. Freeman, R. Krishnasamy
RFCMOS technology from 0.25μm to 65nm: the state of the art. CICC (2004)
James S. Dunn, David C. Ahlgren, Douglas D. Coolbaugh, Natalie B. Feilchenfeld, Greg G. Freeman, David R. Greenberg, Robert A. Groves, Fernando J. Guarín, Youssef Hammad, Alvin J. Joseph, Louis D. Lanzerotti, Stephen A. St. Onge, Bradley A. Orner, Jae-Sung Rieh, Kenneth J. Stein, Steven H. Voldman, Ping-Chuan Wang, Michael J. Zierak, Seshadri Subbanna, David L. Harame, Dean A. Herman Jr., Bernard S. Meyerson
Foundation of rf CMOS and SiGe BiCMOS technologies. IBM J. Res. Dev. 47 (2-3) (2003)