Dennis D. Weller

Publication Activity (10 Years)

Years Active: 2019-2022
Publications (10 Years): 11

Top Topics

Density Estimation

Sequential Monte Carlo

Importance Sampling

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Michael Hefenbrock, Dennis D. Weller, Jasmin Aghassi-Hagmann, Michael Beigl, Mehdi B. Tahoori
In-situ Tuning of Printed Neural Networks for Variation Tolerance. DATE (2022)
Surya A. Singaraju, Dennis D. Weller, Thurid S. Gspann, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
Artificial Neurons on Flexible Substrates: A Fully Printed Approach for Neuromorphic Sensing. Sensors 22 (11) (2022)
Dennis D. Weller, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
Fast and Efficient High-Sigma Yield Analysis and Optimization Using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (3) (2022)
Dennis D. Weller, Nathaniel Bleier, Michael Hefenbrock, Jasmin Aghassi-Hagmann, Michael Beigl, Rakesh Kumar, Mehdi B. Tahoori
Printed Stochastic Computing Neural Networks. DATE (2021)
Dennis D. Weller, Michael Hefenbrock, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Michael Beigl
Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors. ASP-DAC (2020)
Ahmet Turan Erozan, Dennis D. Weller, Farhan Rasheed, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit. IEEE Trans. Very Large Scale Integr. Syst. 28 (6) (2020)
Ahmet Turan Erozan, Dennis D. Weller, Yijing Feng, Gabriel Cadilha Marques, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
A Printed Camouflaged Cell Against Reverse Engineering of Printed Electronics Circuits. IEEE Trans. Very Large Scale Integr. Syst. 28 (11) (2020)
Muhammad Husnain Mubarik, Dennis D. Weller, Nathaniel Bleier, Matthew Tomei, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar
Printed Machine Learning Classifiers. MICRO (2020)
Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori
Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling. DATE (2020)
Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (10) (2020)
Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Mehdi Baradaran Tahoori
Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation. DATE (2019)