Chih-Chun Tsai

Publication Activity (10 Years)

Years Active: 2009-2022
Publications (10 Years): 2

Top Topics

Statistical Significance

Sufficiently Small

Highly Reliable

Top Venues

IEEE Trans. Reliab.

Commun. Stat. Simul. Comput.

Publications

Shun-Yi Chen, Chih-Chun Tsai, Hubert J. Chen, Su-Hao Lee
Optimal confidence interval for the largest exponential location parameter. Commun. Stat. Simul. Comput. 51 (7) (2022)
Chih-Chun Tsai, Chien-Tai Lin, Narayanaswamy Balakrishnan
Lamination Scheme of Curing Degree at Multiple Levels of Temperature With Location-Scale Regression. IEEE Access 9 (2021)
Chih-Chun Tsai, Chien-Tai Lin
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model. IEEE Trans. Reliab. 64 (4) (2015)
Chih-Chun Tsai, Chien-Tai Lin, Narayanaswamy Balakrishnan
Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process. IEEE Trans. Reliab. 64 (2) (2015)
Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan
Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects. IEEE Trans. Reliab. 61 (2) (2012)
Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan
Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process. IEEE Trans. Reliab. 60 (1) (2011)
Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan, Chih-Chun Tsai
Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes. IEEE Trans. Reliab. 58 (4) (2009)