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Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model.

Chih-Chun TsaiChien-Tai Lin
Published in: IEEE Trans. Reliab. (2015)
Keyphrases
  • highly reliable
  • objective function
  • em algorithm
  • bayesian model
  • neural network
  • similarity measure
  • prior knowledge
  • experimental data
  • test data
  • conceptual model
  • neural network model