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Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects.
Chih-Chun Tsai
Sheng-Tsaing Tseng
Narayanaswamy Balakrishnan
Published in:
IEEE Trans. Reliab. (2012)
Keyphrases
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optimal design
random effects
mixed effects
biometric authentication systems
hidden markov models
water supply
hierarchical structure
multi dimensional
image sequences
face recognition
bayesian networks
relational databases