Sheng-Tsaing Tseng

Publication Activity (10 Years)

Years Active: 1992-2023
Publications (10 Years): 7

Top Topics

Statistical Approaches

Linear Gaussian

Top Venues

IEEE Trans. Reliab.

Reliab. Eng. Syst. Saf.

Publications

Marzieh Khakifirooz, Michel Fathi, I-Chen Lee, Sheng-Tsaing Tseng
Neural ordinary differential equation for sequential optimal design of fatigue test under accelerated life test analysis. Reliab. Eng. Syst. Saf. 235 (2023)
Marzieh Khakifirooz, Sheng-Tsaing Tseng, Mahdi Fathi
Model Misspecification of Generalized Gamma Distribution for Accelerated Lifetime-Censored Data. Technometrics 62 (3) (2020)
Sheng-Tsaing Tseng, Fugee Tsung, Jo-Hua Wu
Stability conditions and robustness analysis of a general MMSE run-to-run controller. IISE Trans. 51 (11) (2019)
I-Chen Lee, Yili Hong, Sheng-Tsaing Tseng, Tirthankar Dasgupta
Sequential Bayesian Design for Accelerated Life Tests. Technometrics 60 (4) (2018)
Sheng-Tsaing Tseng, Pei-Yu Chen
A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic Models. Technometrics 59 (3) (2017)
Sheng-Tsaing Tseng, I-Chen Lee
Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models. Technometrics 58 (2) (2016)
Sheng-Tsaing Tseng, Hsin-Chao Mi, I-Chen Lee
A Multivariate EWMA Controller for Linear Dynamic Processes. Technometrics 58 (1) (2016)
Nan-Jung Hsu, Sheng-Tsaing Tseng, Ming-Wei Chen
Adaptive Warranty Prediction for Highly Reliable Products. IEEE Trans. Reliab. 64 (3) (2015)
Chien-Yu Peng, Sheng-Tsaing Tseng
Statistical Lifetime Inference With Skew-Wiener Linear Degradation Models. IEEE Trans. Reliab. 62 (2) (2013)
Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan
Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects. IEEE Trans. Reliab. 61 (2) (2012)
Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan
Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process. IEEE Trans. Reliab. 60 (1) (2011)
Chien-Yu Peng, Sheng-Tsaing Tseng
Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products. IEEE Trans. Reliab. 59 (1) (2010)
Ming-Da Ma, David Shan-Hill Wong, Shi-Shang Jang, Sheng-Tsaing Tseng
Fault Detection based on Statistical Multivariate Analysis and Microarray-type Visualization. IEEE Trans. Ind. Informatics 6 (1) (2010)
Sheng-Tsaing Tseng, Bo-Yan Jou
A Technical Note on "Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller". Technometrics 51 (3) (2009)
Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan, Chih-Chun Tsai
Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes. IEEE Trans. Reliab. 58 (4) (2009)
Chien-Yu Peng, Sheng-Tsaing Tseng
Mis-Specification Analysis of Linear Degradation Models. IEEE Trans. Reliab. 58 (3) (2009)
Sheng-Tsaing Tseng, Jen Tang, Chien-Hua Lin
Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller. Technometrics 49 (4) (2007)
Chen-Mao Liao, Sheng-Tsaing Tseng
Optimal design for step-stress accelerated degradation tests. IEEE Trans. Reliab. 55 (1) (2006)
Ruey Huei Yeh, Wen-Tsung Ho, Sheng-Tsaing Tseng
Optimal production run length for products sold with warranty. Eur. J. Oper. Res. 120 (3) (2000)
Ching-Jong Liao, Rong-Hwa Huang, Sheng-Tsaing Tseng
Use of variable range in solving multiple criteria scheduling problems. Comput. Oper. Res. 19 (5) (1992)