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Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes.
Sheng-Tsaing Tseng
Narayanaswamy Balakrishnan
Chih-Chun Tsai
Published in:
IEEE Trans. Reliab. (2009)
Keyphrases
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dynamic programming
data sets
optimal solution
database
optimal design
ai planning
image degradation
database systems
software engineering
post processing
degraded images