Chengzhan Li

Publication Activity (10 Years)

Years Active: 2007-2016
Publications (10 Years): 1

Top Topics

Field Effect Transistors

Reliability Analysis

Simulated Annealing

Structural Properties

Top Venues

Microelectron. Reliab.

Publications

Zhaoyang Peng, Yiyu Wang, Huajun Shen, Chengzhan Li, Jia Wu, Yun Bai, Kean Liu, Xinyu Liu
Effects of combined NO and forming gas annealing on interfacial properties and oxide reliability of 4H-SiC MOS structures. Microelectron. Reliab. 58 (2016)
Weijun Luo, Ke Wei, Xiaojuan Chen, Chengzhan Li, Xinyu Liu, Xiaoliang Wang
Structure optimization of field-plate AlGaN/GaN HEMTs. Microelectron. J. 38 (2) (2007)