Changchun Zhu

Publication Activity (10 Years)

Years Active: 2002-2019
Publications (10 Years): 1

Top Topics

High Sensitivity

Digital Image Processing

Top Venues

IEEE Trans. Instrum. Meas.

IEEE Trans. Ind. Electron.

Publications

Yang Feng, Zixuan Lu, Wenke Lu, Changchun Zhu, Qinghong Liu, Haoxin Zhang
Study of the Doubly Clamped Beam Yarn Tension Sensor Based on the Surface Acoustic Wave. IEEE Trans. Ind. Electron. 66 (4) (2019)
Xiaozhou Lü, Wenke Lu, Changchun Zhu
Compensated SAW Yarn Tension Sensor. IEEE Trans. Instrum. Meas. 63 (12) (2014)
Wenke Lu, Changchun Zhu
Solving Three Key Problems of Wavelet Transform Processor Using Surface Acoustic Wave Devices. IEEE Trans. Ind. Electron. 57 (11) (2010)
Zhou Chungui, Zhang Xinong, Xie Shilin, Zhou Tong, Changchun Zhu
Hybrid modeling of wire cable vibration isolation system through neural network. Math. Comput. Simul. 79 (10) (2009)
Changbao Wen, Changchun Zhu, Yongfeng Ju, Yanzhang Qiu, Hongke Xu, Wenke Lu
Optimal Frequency Band Design Scheme of Dyadic Wavelet Processor Array Using Surface Acoustic Wave Devices. IEEE Trans. Ind. Electron. 56 (4) (2009)
Shiguang Shang, Changchun Zhu, Weihua Liu
Enhanced field emission from printed CNTs by high-temperature sintering and plasma bombarding in hydrogen. Microelectron. J. 39 (1) (2008)
Changhui Tian, Changchun Zhu, Xinghui Liu, Xiaoli Wang, Qikun Wang
Observation on CNT-FED under various vacuum levels and calculation on number of electron-gas collisions. Displays 27 (4-5) (2006)
Weihua Liu, Changchun Zhu, Cao Meng, Fanguang Zeng
On the uniformity of field emission in screen printed CNT-cathodes: The effects of the cathode roughness. Microelectron. J. 37 (5) (2006)
Ying Wang, Changchun Zhu, Chunyu Wu, Junhua Liu
Improving reliability of beveled power semiconductor devices passivated by SIPOS. Microelectron. Reliab. 45 (3-4) (2005)
Shoucai Yuan, Changchun Zhu
An IGBT DC subcircuit model with non-destructive parameters extraction and comparison with measurements. Microelectron. Reliab. 42 (12) (2002)