An IGBT DC subcircuit model with non-destructive parameters extraction and comparison with measurements.
Shoucai YuanChangchun ZhuPublished in: Microelectron. Reliab. (2002)
Keyphrases
- measured data
- high level
- probabilistic model
- mathematical model
- measurement data
- parameter values
- computational model
- theoretical framework
- estimation process
- parameter estimation
- management system
- social networks
- information extraction
- point correspondences
- formal model
- maximum likelihood estimation
- analytical model
- prior knowledge
- evolutionary algorithm
- objective function
- image measurements