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Improving reliability of beveled power semiconductor devices passivated by SIPOS.

Ying WangChangchun ZhuChunyu WuJunhua Liu
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • semiconductor devices
  • electron beam
  • power consumption
  • highly reliable
  • neural network
  • database
  • data warehouse
  • x ray
  • reliability analysis
  • power distribution