TRAINING AND TEST SETS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Hideo Ito
- Masashi Sugiyama
- Maria K. Michael
- Francis Wlazinski
- Seiji Kajihara
- Stelios Neophytou
- Gwénaël Richomme
- Gang Zeng
- Guillermo Sapiro
- Kozo Kinoshita
- Manuj Aggarwal
- Jacob L. Jaremko
- Ondrej Bojar
- Pouneh Gorji
- Xuebo Liu
- Miguel R. D. Rodrigues
- Derek F. Wong
- Sandeep K. Gupta
- Robert Weismantel
- Zichen Vincent Zhang
- Sangeeta Sabharwal
- Jeevesh Kapur
- Janusz Rajski
- Nan Lu
- Maria Huber
- Gang Niu
- Taghi M. Khoshgoftaar
- Jennifer Dworak
- Dominik Machácek
- Aditya Krishna Menon
- Alberto L. Sangiovanni-Vincentelli
- Raja Giryes
- Tereza Vojtechová
- Russell Greiner
- Abhilash Rakkunedeth Hareendranathan
- Dieter Hofbauer
- Jure Sokolic
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- IEEE Trans. Very Large Scale Integr. Syst.
- VTS
- Asian Test Symposium
- J. Chem. Inf. Model.
- ETS
- DAC
- ITC
- AISTATS
- HASE
- DATE
- J. Circuits Syst. Comput.
- ICASSP
- NIPS
- J. Comput. Syst. Sci.
- J. Electron. Test.
- IEEE Access
- Nat. Mac. Intell.
- SSPR/SPR
- ICST
- VLSI Design
- IEICE Trans. Inf. Syst.
- RTA
- CVPR
- Knowl. Based Syst.
- Microprocess. Microsystems
- PODC
- ICNN
- EUROSPEECH
- ISSRE
- Neurocomputing
- ICACCI
- EAIS
- SAC
- GECCO
- ACL (Findings)
- ATS
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