TOF CAMERA
Experts
- Andreas Kolb
- Joachim Hornegger
- Norbert Druml
- Felix Heide
- Lee V. Streeter
- Ramesh Raskar
- Miguel Heredia Conde
- Christian Steger
- Gerald Holweg
- Jochen Penne
- Erhardt Barth
- Bruno Mirbach
- Reinhard Koch
- Otmar Loffeld
- Michael J. Cree
- Adrian A. Dorrington
- Ayush Bhandari
- Manuel Mazo
- Bedrich J. Hosticka
- Achuta Kadambi
- Lena Maier-Hein
- Matthias B. Hullin
- Didier Stricker
- Domenico Giustiniano
- Wolfgang Heidrich
- Dirk Holz
- Hannes Plank
- Shoji Kawahito
- David Droeschel
- Nassir Navab
- Rasmus Larsen
- Hans-Peter Meinzer
- Radu Horaud
- Ruigang Yang
- Gordon Wetzstein
- Stefan Fuchs
- Jason R. Rambach
- Martin Böhme
- Martin Haker
Venues
- CoRR
- Sensors
- CVPR
- IEEE Trans. Instrum. Meas.
- CVPR Workshops
- ICIP
- IEEE SENSORS
- IROS
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISCAS
- ICRA
- IEEE Access
- 3DV
- DSD
- Dyn3D
- ICCV
- Bildverarbeitung für die Medizin
- Int. J. Intell. Syst. Technol. Appl.
- I2MTC
- Comput. Vis. Image Underst.
- WACV
- IPIN
- IVCNZ
- ESSCIRC
- MWSCAS
- VISAPP (1)
- Three-Dimensional Image Processing (3DIP) and Applications
- IEEE J. Solid State Circuits
- Expert Syst. Appl.
- ICASSP
- Time-of-Flight and Depth Imaging
- RoboCup
- IEEE Trans. Medical Imaging
- ICPR
- Image Vis. Comput.
- VMV
- Remote. Sens.
- DATE
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