TESTING PHASE
Experts
- Rong Jin
- Zheming Zuo
- Guanjie Zheng
- Garry Terii
- Hua Wei
- Hang Zhang
- Zhenhui Li
- Seyed Mohammad Razavizadeh
- Elie Bretin
- Huichu Zhang
- Seongyeon Kim
- Xiaodong He
- Lucas Woltmann
- Roland Denis
- Junwei Bao
- Alexander Cloninger
- Claudio Hartmann
- Ihyeok Seo
- Jie Feng
- Dirk Habich
- Bonggun Shin
- Fatemeh Ashrafi
- Xinshi Zang
- Guangyi Liu
- Lia Ahrens
- Tiejun Zhao
- Dieter Hogrefe
- Miguel González-Mendoza
- Wolfgang Lehner
- Julian Ahrens
- Hans D. Schotten
- Parisa Memarmoshrefi
- Youzheng Wu
- Simon Masnou
- Zhuoning Yuan
- Yuanhao Xiong
- Bowen Zhou
- Kai Xu
- Han Xu
Venues
- CoRR
- Sensors
- ICASSP
- ITC
- ICCE
- NeurIPS
- KDD
- IEEE Access
- Sci. China Inf. Sci.
- CIKM
- ERCIM News
- NeuroImage
- J. Syst. Softw.
- ESEM
- URAI
- J. Comput. Neurosci.
- ATS
- ICSME
- CogSci
- Inf. Process. Lett.
- ICST Workshops
- FNC/MobiSPC
- AHFE (6)
- Comput. Educ.
- AAAI Fall Symposium: AI and Consciousness
- J. Comput. Phys.
- IAS
- SSCI
- BTW
- WACV
- COLING
- HVEI
- MedInfo
- CinC
- Asian Test Symposium
- IoTBDS
- INTERSPEECH
- Comput. Chem. Eng.
- CAMAD
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