STATISTICAL TESTS
Experts
- Irith Pomeranz
- Krishnendu Chakrabarty
- Sudhakar M. Reddy
- Matteo Sonza Reorda
- Vincent Y. F. Tan
- Michèle A. Wigger
- Janusz Rajski
- Xin Luo
- Hans-Joachim Wunderlich
- Alex Orailoglu
- Sadaf Salehkalaibar
- Vishwani D. Agrawal
- Salvador Mir
- Said Hamdioui
- Ernesto Sánchez
- Venugopal V. Veeravalli
- Abdelhak M. Zoubir
- Weijian Liu
- Erik Jan Marinissen
- Ankit Agrawal
- Ad J. van de Goor
- Yervant Zorian
- Kwang-Ting Cheng
- Nur A. Touba
- Haralampos-G. D. Stratigopoulos
- Liang Liang
- Deniz Gündüz
- Tara Javidi
- Patrick Kenny
- Paolo Bernardi
- Adit D. Singh
- Hideo Fujiwara
- Abhijit Chatterjee
- Yonglong Li
- Li-C. Wang
- Jerzy Tyszer
- Sandeep K. Gupta
- Erik Larsson
- Arthur Gretton
Venues
- CoRR
- ITC
- Bioinform.
- Commun. Stat. Simul. Comput.
- Comput. Stat. Data Anal.
- BMC Bioinform.
- J. Multivar. Anal.
- VTS
- IEEE Trans. Inf. Theory
- ICASSP
- J. Electron. Test.
- Eur. J. Oper. Res.
- NeuroImage
- ISIT
- IEEE Access
- Asian Test Symposium
- IEEE Trans. Signal Process.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Des. Test Comput.
- Technometrics
- Entropy
- Sensors
- DATE
- INTERSPEECH
- Microelectron. Reliab.
- Qual. Reliab. Eng. Int.
- Expert Syst. Appl.
- ETS
- IEEE Trans. Instrum. Meas.
- EMBC
- Remote. Sens.
- Appl. Math. Comput.
- Symmetry
- Briefings Bioinform.
- Stat. Comput.
- ICST
- Comput. Stat.
- DAC
- J. Oper. Res. Soc.
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