STATISTICAL MODELING
Experts
- David T. Blaauw
- Hidetoshi Onodera
- Dennis Sylvester
- Michael I. Jordan
- Genshiro Kitagawa
- Christopher J. Taylor
- Colin C. McAndrew
- Timothy F. Cootes
- Alex M. McKenzie
- Keikichi Hirose
- Antanas Zilinskas
- Nam Soo Kim
- Keiichi Tokuda
- Taisuke Sato
- Stan Lipovetsky
- Michael Gutmann
- Yoshihiko Nankaku
- Mingyuan Zhou
- Koji Iwano
- Rajiv V. Joshi
- Alan C. Bovik
- Serhan Yarkan
- Gordon L. Stüber
- Yu Cao
- Young Hwan Kim
- Jong Won Shin
- Robert Schober
- Alexey Milovanov
- Sani R. Nassif
- Aapo Hyvärinen
- George K. Karagiannidis
- Alenka G. Zajic
- Igor Mandel
- Matthias Pätzold
- Alejandro F. Frangi
- Rouwaida Kanj
- Max Mignotte
- Hedieh Ajam
- Eric R. Ziegel
Venues
- CoRR
- IEEE Access
- Technometrics
- ICASSP
- WSC
- Remote. Sens.
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IGARSS
- IEEE Trans. Commun.
- INTERSPEECH
- Entropy
- IEEE Trans. Wirel. Commun.
- DAC
- Reliab. Eng. Syst. Saf.
- J. Chem. Inf. Model.
- EMBC
- AMIA
- ISCAS
- BMC Bioinform.
- Bioinform.
- KDD
- IEEE Trans. Ind. Electron.
- ICRA
- ACC
- Symmetry
- NIPS
- GLOBECOM
- ICCAD
- Comput. Biol. Medicine
- IEEE Trans. Instrum. Meas.
- J. Open Source Softw.
- AAAI
- Environ. Model. Softw.
- PLoS Comput. Biol.
- AISTATS
- IEEE Trans. Geosci. Remote. Sens.
- ICML
- IROS
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