SKIN DETECTION
Experts
- Stan Z. Li
- Mohamed Daoudi
- Wen Gao
- Hsin-Liu Cindy Kao
- Michal Kawulok
- Thomas S. Huang
- Juan P. Wachs
- Allison M. Okamura
- Abdesselam Bouzerdoum
- Sergio Escalera
- Hazem M. El-Bakry
- Xilin Chen
- Ravinder Dahiya
- Modesto Castrillón Santana
- Raimondo Schettini
- Norimichi Tsumura
- William R. Provancher
- Ahmed Bouridane
- Douglas Chai
- Isabelle Guyon
- Xiaoou Tang
- Hiroyuki Kajimoto
- Jürgen Steimle
- Mark D. Fairchild
- Richa Singh
- Gongfa Li
- Vijayan K. Asari
- Loris Nanni
- Bruno Jedynak
- Julian Stöttinger
- Hadi Heidari
- Yoshihiro Tanaka
- Jun Wan
- Rita Cucchiara
- Kamal Chenaoua
- Vishal M. Patel
- Jakub Nalepa
- Vassilis Athitsos
- Chengjun Liu
Venues
- CoRR
- Sensors
- ICIP
- FG
- Multim. Tools Appl.
- ICPR
- Pattern Recognit.
- IEEE Access
- Color Imaging Conference
- ICRA
- IROS
- EMBC
- SMC
- CVPR
- CHI
- Pattern Recognit. Lett.
- ICASSP
- IEEE Trans. Biomed. Eng.
- IEEE Trans. Image Process.
- IEEE Trans. Instrum. Meas.
- CIC
- ICME
- CVPR Workshops
- Gesture Workshop
- Int. J. Pattern Recognit. Artif. Intell.
- CIARP
- MVA
- FGR
- Image Vis. Comput.
- Comput. Vis. Image Underst.
- CHI Extended Abstracts
- ROBIO
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Electronic Imaging
- IJCNN
- WACV
- ICIP (1)
- IEEE Trans. Haptics
- ISCAS
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend