SEARCH BASED TESTING
Experts
- Irith Pomeranz
- Krishnendu Chakrabarty
- Mark Harman
- Phil McMinn
- Dunwei Gong
- Lionel C. Briand
- Janusz Rajski
- Anshuman Chandra
- Robert Feldt
- Dimitris Nikolos
- Xrysovalantis Kavousianos
- Sudhakar M. Reddy
- Jerzy Tyszer
- Bogdan Korel
- Tanja E. J. Vos
- Emmanouil Kalligeros
- Arnaud Gotlieb
- Nur A. Touba
- John A. Clark
- Yan Zhang
- Andrea Arcuri
- Gordon Fraser
- Mohammad F. J. Klaib
- Kiran Lakhotia
- Xiangjuan Yao
- Seiji Kajihara
- Joachim Wegener
- Anastasis A. Sofokleous
- Xiaowei Li
- Shuo Feng
- Andreas S. Andreou
- Tian Tian
- Saeed Parsa
- Elaine J. Weyuker
- Hassan Haghighi
- Franz Wotawa
- Ina Schieferdecker
- Henry X. Liu
- Silvia Regina Vergilio
Venues
- CoRR
- ITC
- ASE
- IEEE Trans. Software Eng.
- ICST Workshops
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICST
- Inf. Softw. Technol.
- GECCO
- J. Syst. Softw.
- J. Electron. Test.
- ACM SIGSOFT Softw. Eng. Notes
- Softw. Test. Verification Reliab.
- ICSE
- DAC
- VTS
- ISSTA
- IEEE Access
- DATE
- ISSRE
- COMPSAC
- SSBSE
- IEEE Trans. Very Large Scale Integr. Syst.
- ICTSS
- Asian Test Symposium
- SEKE
- AST
- IET Comput. Digit. Tech.
- Softw. Qual. J.
- IEICE Trans. Inf. Syst.
- ACM Trans. Softw. Eng. Methodol.
- QSIC
- ICSME
- QRS Companion
- ITSC
- ATS
- IEEE Congress on Evolutionary Computation
- Int. J. Softw. Eng. Knowl. Eng.
- VLSI Design
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