SCAN DATA
Experts
- Irith Pomeranz
- Azim Eskandarian
- James E. Brittain
- Sudhakar M. Reddy
- Wu-Tung Cheng
- Ozgur Sinanoglu
- Jian Pang
- Tomoo Ushio
- Kenichi Okada
- Atsushi Shirane
- Hiroshi Kikuchi
- Guifu Zhang
- Ali Hajimiri
- Petros A. Ioannou
- Jianyu Yang
- Arun Natarajan
- Masao Yanagisawa
- Yulin Huang
- Xiaohua Tian
- Janusz Rajski
- Yu Huang
- Hideo Fujiwara
- Alberto Valdes-Garcia
- Nozomu Togawa
- Yongyi Yang
- Ashbir Aviat Fadila
- Zheng Li
- Rohit Kapur
- Dongwon You
- Yun Wang
- Gert Frølund Pedersen
- Gabriel M. Rebeiz
- Eiichi Yoshikawa
- Naoki Oshima
- Kazuaki Kunihiro
- Virendra Singh
- Dong Xiang
- Rui Wu
- Fumihiko Mizutani
Venues
- IEEE Access
- Proc. IEEE
- CoRR
- IEEE Trans. Geosci. Remote. Sens.
- Sensors
- IGARSS
- ITC
- IEEE J. Solid State Circuits
- IEEE Trans. Intell. Transp. Syst.
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Medical Imaging
- IEEE Trans. Instrum. Meas.
- ISSCC
- Remote. Sens.
- VTS
- ISBI
- IEEE Trans. Aerosp. Electron. Syst.
- OFC
- ICASSP
- ICRA
- RWS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Autom. Control.
- IEICE Trans. Commun.
- IEEE Trans. Biomed. Eng.
- Wirel. Pers. Commun.
- IEEE Trans. Circuits Syst. II Express Briefs
- J. Electron. Test.
- ICIP
- EMBC
- IEICE Trans. Electron.
- IEEE Trans. Veh. Technol.
- Microelectron. Reliab.
- ISCAS
- NeuroImage
- IROS
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- CICC
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