RECOGNITION PROCESS
Experts
- Ching Y. Suen
- Björn W. Schuller
- Felipe Meneguzzi
- Reuth Mirsky
- Andreas Uhl
- Douglas A. Reynolds
- Christopher W. Geib
- Haizhou Li
- Josef Bigün
- Gerhard Rigoll
- Umapada Pal
- Christoph Busch
- Masaki Nakagawa
- Cheng-Lin Liu
- Fumitaka Kimura
- Daniel Roggen
- Nikos Fakotakis
- Ramon Fraga Pereira
- Tieniu Tan
- Terrance E. Boult
- Bin Ma
- Derek G. Corneil
- Emmanouil Benetos
- Tanja Schultz
- Robert P. Goldman
- Fernando Alonso-Fernandez
- Henry S. Baird
- Richard Zanibbi
- Ya'akov (Kobi) Gal
- Olga Sourina
- Yisi Liu
- Zhenan Sun
- James F. Allen
- Malayappan Shridhar
- Kaiqi Huang
- Qining Wang
- Andrzej Pelc
- Hiromichi Fujisawa
- Stanislaw Osowski
Venues
- CoRR
- IEEE Access
- INTERSPEECH
- ICDAR
- ICASSP
- Sensors
- CVPR
- Pattern Recognit.
- ICPR
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- AAAI
- SMC
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- Int. J. Pattern Recognit. Artif. Intell.
- CogSci
- IJCAI
- IJCNN
- Neurocomputing
- IROS
- Expert Syst. Appl.
- 计算机科学
- CVPR Workshops
- ICRA
- Speech Commun.
- IEEE Trans. Instrum. Meas.
- Discret. Appl. Math.
- ICCV
- ACM Multimedia
- Comput. Electron. Agric.
- Image Vis. Comput.
- EMBC
- EUROSPEECH
- J. Intell. Fuzzy Syst.
- Symmetry
- GREC
- Systems and Computers in Japan
- ICSLP
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