RAW MATERIAL
Experts
- George Q. Huang
- Leopoldo Eduardo Cárdenas-Barrón
- Jean-Pierre Kenné
- Hui-Ming Wee
- Biswajit Sarkar
- Ata Allah Taleizadeh
- Ali Gharbi
- Lixin Tang
- Francesco Martinelli
- Fei Tao
- Damien Trentesaux
- Jingshan Li
- Chih-Hsiung Wang
- Bhaba R. Sarker
- Paul Valckenaers
- P. C. Jha
- Tsu-Pang Hsieh
- Mohammed Dahane
- Jinn-Tsair Teng
- Alexandre Dolgui
- Nidhal Rezg
- Liang-Yuh Ouyang
- Zheng Wang
- Tzyh Jong Tarn
- Ying Cheng
- Youyi Feng
- Anshu Gupta
- Przemyslaw Ignaciuk
- Shey-Huei Sheu
- Sven Jacobi
- Hao Zhang
- Paulo Leitão
- Leo van Moergestel
- Konstantina Skouri
- Erik Puik
- Cong Zhao
- Adnène Hajji
- André Thomas
- Lei Wang
Venues
- Eur. J. Oper. Res.
- Comput. Ind. Eng.
- CoRR
- Int. J. Prod. Res.
- WSC
- IEEE Access
- Oper. Res.
- Comput. Chem. Eng.
- J. Intell. Manuf.
- IEEM
- IEEE Trans. Autom. Control.
- Int. J. Comput. Integr. Manuf.
- Comput. Oper. Res.
- Int. J. Syst. Sci.
- CASE
- J. Oper. Res. Soc.
- Manuf. Serv. Oper. Manag.
- Ann. Oper. Res.
- ACC
- ETFA
- Int. J. Manuf. Technol. Manag.
- Manag. Sci.
- APMS
- IEEE Trans. Engineering Management
- APMS (2)
- CDC
- Expert Syst. Appl.
- IECON
- IEEE Trans. Ind. Electron.
- ICRA
- Sensors
- Autom.
- Decis. Sci.
- APMS (1)
- RAIRO Oper. Res.
- IEEE Trans Autom. Sci. Eng.
- IGARSS
- Comput. Ind.
- IEEE Trans. Ind. Informatics
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