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Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Salil P. Vadhan
- Bhargab B. Bhattacharya
- Pascal Germain
- Janusz Rajski
- Dipak Kumar Kole
- Zvi Lotker
- Shashank Singh
- Jennifer Dworak
- Emilie Morvant
- Petru Eles
- Palash Sarkar
- Edward J. McCluskey
- Harry Buhrman
- Seiji Kajihara
- Zebo Peng
- Amaury Habrard
- Hafizur Rahaman
- Zhiyuan He
- Xrysovalantis Kavousianos
- Yongyi Su
- Michal Koucký
- Matthias Hamann
- Kui Jia
- Alphan Sahin
- Ran El-Yaniv
- Xun Xu
- Stelios Neophytou
- Matthias Christandl
- Christian Igel
- Mario Marchand
- Boaz Patt-Shamir
- Yevgeny Seldin
- Srimat T. Chakradhar
- W. Eric Wong
- Hans-Joachim Wunderlich
- Saurabh Sanghvi
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ITC
- IEEE Trans. Computers
- VLSI Design
- J. Electron. Test.
- IEEE Access
- Asian Test Symposium
- DATE
- ATS
- IEEE Trans. Very Large Scale Integr. Syst.
- DFT
- J. Mach. Learn. Res.
- VTS
- ICML
- AAAI
- IEICE Trans. Inf. Syst.
- IEEE Trans. Software Eng.
- J. Syst. Softw.
- ETS
- DAC
- AMIA
- IACR Cryptol. ePrint Arch.
- Multim. Tools Appl.
- J. Chem. Inf. Model.
- IEEE Trans. Instrum. Meas.
- CEC
- GECCO
- Inf. Process. Lett.
- ICSM
- NIPS
- Inf. Sci.
- IJCAI
- ICASSP
- ICST
- IJCNN
- ISSRE
- IET Comput. Digit. Tech.
- ISQED
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