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Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Pascal Germain
- Salil P. Vadhan
- Bhargab B. Bhattacharya
- Dipak Kumar Kole
- Hafizur Rahaman
- Shashank Singh
- Palash Sarkar
- Harry Buhrman
- Edward J. McCluskey
- Zvi Lotker
- Zebo Peng
- Jennifer Dworak
- Amaury Habrard
- Emilie Morvant
- Janusz Rajski
- Petru Eles
- Seiji Kajihara
- Kozo Kinoshita
- Akira Taketani
- Saurabh Sanghvi
- Alphan Sahin
- Spyros Tragoudas
- Ran El-Yaniv
- Nikolai K. Vereshchagin
- Hideo Fujiwara
- Stephan Sloth Lorenzen
- W. Eric Wong
- François Laviolette
- Andrés R. Masegosa
- Zhiyuan He
- Matthias Krause
- Yongyi Su
- Sariel Har-Peled
- Maria K. Michael
- Christian Igel
- Xun Xu
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ITC
- IEEE Trans. Computers
- J. Electron. Test.
- VLSI Design
- DATE
- IEEE Access
- Asian Test Symposium
- DFT
- ATS
- IEEE Trans. Very Large Scale Integr. Syst.
- ICML
- J. Mach. Learn. Res.
- VTS
- IEEE Trans. Software Eng.
- J. Syst. Softw.
- ETS
- AAAI
- IEICE Trans. Inf. Syst.
- EMBC
- ICST
- ICASSP
- NIPS
- ICSM
- CEC
- IEEE Trans. Instrum. Meas.
- Inf. Sci.
- Inf. Process. Lett.
- IJCNN
- ISQED
- IJCAI
- IET Comput. Digit. Tech.
- DAC
- GECCO
- IACR Cryptol. ePrint Arch.
- Multim. Tools Appl.
- AMIA
- J. Chem. Inf. Model.
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