OCCLUSION DETECTION
Experts
- Chen Change Loy
- Xuezhi Xiang
- Thomas Brox
- Deqing Sun
- Ning Lv
- Michael J. Black
- Ang Li
- Congxuan Zhang
- Zejian Yuan
- Guangming Shi
- Xiaoguang Niu
- Horst Bischof
- Michael G. Strintzis
- Tak-Wai Hui
- Abdulmotaleb El-Saddik
- Guoqing Zhou
- Wei Wang
- Jenq-Neng Hwang
- Zhen Chen
- Kun Huang
- Xiaoyu Shi
- Zhaoyang Huang
- Mingliang Zhai
- Hanzi Wang
- Antonis A. Argyros
- Ismail Ben Ayed
- Javier Sánchez Pérez
- Ruiqin Xiong
- Dimitris N. Metaxas
- Hongsheng Li
- Sugata Ghosal
- Liming Chen
- Martin Maska
- Hujun Bao
- Hengli Wang
- Dimitrios Tzovaras
- Chi-Keung Tang
- Eddy Ilg
- Janusz Konrad
Venues
- CoRR
- CVPR
- ICIP
- IEEE Trans. Image Process.
- Sensors
- ICPR
- BMVC
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- ICASSP
- IEEE Access
- IROS
- IEEE Trans. Circuits Syst. Video Technol.
- Int. J. Comput. Vis.
- ICIP (2)
- ICIP (3)
- WACV
- Pattern Recognit.
- CVPR Workshops
- ECCV (1)
- ROBIO
- Image Vis. Comput.
- Vis. Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- VCIP
- Comput. Vis. Image Underst.
- ICPR (1)
- Signal Process. Image Commun.
- AAAI
- FG
- ECCV (2)
- SCIA
- IET Comput. Vis.
- Signal Image Video Process.
- IEEE Trans. Multim.
- DAGM-Symposium
- Mach. Vis. Appl.
- ACIVS
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