OBJECT INSTANCES
Experts
- Stian Soiland-Reyes
- Martin Gogolla
- Max Schwarz
- Ming-Hsuan Yang
- Patrick de Bondeli
- Yanchao Yang
- Moritz Gold
- Yukiyasu Domae
- Raquel Urtasun
- Wim Abbeloos
- Ivan Porres
- Dmytro Pavlichenko
- Di Hu
- Ryuhei Hamaguchi
- Lluís Castrejón
- Sergio Caccamo
- Jijoong Moon
- Graeme Smith
- Mert Kilickaya
- Michela Milano
- Yake Wei
- Kishan Sharma
- Christian Lenz
- Diego Rodriguez
- Leonidas J. Guibas
- Sifei Liu
- Laura Leal-Taixé
- Sahar Ahmadi
- Christian Zurbruegg
- Kaustav Kundu
- Yoshitaka Ushiku
- Antonio Tejero-de-Pablos
- Gedas Bertasius
- Ian D. Reid
- Yueqi Duan
- Olga Barinova
- Zheng Ge
- Ali Cheraghian
- Kohei Uehara
Venues
- CoRR
- CVPR
- ICRA
- OOPSLA
- Int. J. Comput. Vis.
- ICPR
- IROS
- ECOOP
- WACV
- ICCV
- CogSci
- ACM Multimedia
- ICASSP
- IEEE Internet Comput.
- ACM SIGSOFT Softw. Eng. Notes
- Pattern Recognit.
- J. Cogn. Neurosci.
- ICME
- WCRE
- Ann. Pure Appl. Log.
- Appl. Categorical Struct.
- MVA
- POPL
- FUZZ-IEEE
- IEEE Trans. Pattern Anal. Mach. Intell.
- Scientometrics
- J. Symb. Log.
- ACM SIGPLAN Notices
- Comput. Vis. Image Underst.
- CSIT
- IEEE Trans. Image Process.
- JCDL
- Dagstuhl Artifacts Ser.
- Comput. Commun.
- ISNN (1)
- PLAS
- ACL (1)
- ICTERI
- BMVC
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