METAL OXIDE SEMICONDUCTOR
Experts
- Piet Wambacq
- Robert Bogdan Staszewski
- Jan Craninckx
- Patrick Reynaert
- Mark A. Anders
- Amit Agarwal
- Vivek De
- Himanshu Kaul
- Steven Hsu
- Ram Krishnamurthy
- Sanu Mathew
- Baoyong Chi
- James W. Tschanz
- Rui Paulo Martins
- Deog-Kyoon Jeong
- Sudhir Satpathy
- Zhihua Wang
- Michiel Steyaert
- Wim Dehaene
- Vikram B. Suresh
- Kofi A. A. Makinwa
- Henrik Sjöland
- Thomas Morf
- Weiwei Shan
- Marcel A. Kossel
- Horst Zimmermann
- Thomas Toifl
- Christian Menolfi
- Dennis Sylvester
- Andrea Mazzanti
- James E. Jaussi
- Samuel Palermo
- Gregory K. Chen
- Kenneth K. O
- Shen-Iuan Liu
- David T. Blaauw
- Krishnan Ravichandran
- Francesco Svelto
- Pavan Kumar Hanumolu
Venues
- IEEE J. Solid State Circuits
- ISSCC
- ISCAS
- CICC
- ESSCIRC
- IEEE Trans. Circuits Syst. II Express Briefs
- Microelectron. Reliab.
- ICECS
- A-SSCC
- IEEE Trans. Circuits Syst. I Regul. Pap.
- Sensors
- VLSI Circuits
- IEEE Trans. Very Large Scale Integr. Syst.
- OFC
- Microelectron. J.
- IET Circuits Devices Syst.
- IEICE Trans. Electron.
- IEEE Access
- CoRR
- MWSCAS
- IEICE Electron. Express
- VLSIC
- ESSDERC
- ASICON
- J. Circuits Syst. Comput.
- NEWCAS
- DAC
- SoCC
- IRPS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICTA
- ASP-DAC
- APCCAS
- ISLPED
- VLSI Technology and Circuits
- VLSI Design
- BCICTS
- IBM J. Res. Dev.
- ISQED
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend