METAL OXIDE SEMICONDUCTOR
Experts
- Robert Bogdan Staszewski
- Piet Wambacq
- Jan Craninckx
- Patrick Reynaert
- Mark A. Anders
- Himanshu Kaul
- Amit Agarwal
- Vivek De
- Steven Hsu
- Ram Krishnamurthy
- Sanu Mathew
- Rui Paulo Martins
- Baoyong Chi
- James W. Tschanz
- Deog-Kyoon Jeong
- Sudhir Satpathy
- Zhihua Wang
- Michiel Steyaert
- Wim Dehaene
- Kofi A. A. Makinwa
- Henrik Sjöland
- Vikram B. Suresh
- Marcel A. Kossel
- Weiwei Shan
- Thomas Morf
- Horst Zimmermann
- Dennis Sylvester
- Thomas Toifl
- Christian Menolfi
- Gregory K. Chen
- Samuel Palermo
- Kenneth K. O
- James E. Jaussi
- Andrea Mazzanti
- Marian Verhelst
- Andrea Baschirotto
- Pavan Kumar Hanumolu
- Francesco Svelto
- Stefano Pellerano
Venues
- IEEE J. Solid State Circuits
- ISSCC
- ISCAS
- CICC
- ESSCIRC
- IEEE Trans. Circuits Syst. II Express Briefs
- Microelectron. Reliab.
- ICECS
- A-SSCC
- IEEE Trans. Circuits Syst. I Regul. Pap.
- Sensors
- VLSI Circuits
- OFC
- IEEE Trans. Very Large Scale Integr. Syst.
- IET Circuits Devices Syst.
- Microelectron. J.
- IEEE Access
- IEICE Trans. Electron.
- CoRR
- MWSCAS
- IEICE Electron. Express
- ESSDERC
- VLSIC
- ASICON
- J. Circuits Syst. Comput.
- NEWCAS
- SoCC
- DAC
- IRPS
- ASP-DAC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICTA
- APCCAS
- ISLPED
- VLSI Design
- VLSI Technology and Circuits
- BCICTS
- IBM J. Res. Dev.
- ICICDT
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