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Experts
- Shuaicheng Liu
- Hideo Saito
- Yijia He
- Torsten Sattler
- Nianjin Ye
- Daniel Barath
- Yosi Keller
- Neil Lutz
- Chunyu Lin
- Nassir Navab
- Guoquan Huang
- Anna-Lena Trautmann
- Wan-Chi Siu
- In-So Kweon
- Chuan Wang
- Martin Jägersand
- Pascal Fua
- Kwangyik Jung
- Joachim Rosenthal
- Jue Wang
- Hyunjun Lim
- Yoli Shavit
- Atsushi Yamashita
- Robert E. Mahony
- Andrey Ignatov
- Xingxing Zuo
- Hai Jiang
- Shoudong Huang
- Jirong Zhang
- Adrien Bartoli
- Tarek Hamel
- Yong Liu
- Jack H. Lutz
- Tien Do
- Yuhang Lu
- Hyun Myung
- Frank C. D. Tsai
- James F. Blinn
- Sudipta N. Sinha
Venues
- CoRR
- IEEE Access
- CVPR
- Sensors
- ICRA
- IROS
- ICCV
- Remote. Sens.
- IEEE Robotics Autom. Lett.
- SIROCCO
- Pattern Recognit.
- ICIP
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- AAAI
- IEEE Trans. Instrum. Meas.
- Discret. Comput. Geom.
- 3DV
- Neurocomputing
- BMVC
- ICME
- ICASSP
- J. Electronic Imaging
- ISPRS Int. J. Geo Inf.
- ACM Multimedia
- Multim. Tools Appl.
- WACV
- Trans. GIS
- Image Vis. Comput.
- ITSC
- CVPR (1)
- 3DPVT
- MVA
- Comput. Vis. Image Underst.
- Bioinform.
- Vis. Comput.
- VISAPP (2)
- Mach. Vis. Appl.
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