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- Shuaicheng Liu
- Hideo Saito
- Nianjin Ye
- Torsten Sattler
- Yijia He
- Nassir Navab
- Chuan Wang
- In-So Kweon
- Neil Lutz
- Guoquan Huang
- Yosi Keller
- Chunyu Lin
- Anna-Lena Trautmann
- Wan-Chi Siu
- Daniel Barath
- Pascal Fua
- Yuhang Lu
- Joachim Rosenthal
- Yeeun Kim
- Hyunjun Lim
- Jack H. Lutz
- Robert E. Mahony
- Haruto Hirosawa
- Kwangyik Jung
- Yong Liu
- Xingxing Zuo
- Tien Do
- Tarek Hamel
- Adrien Bartoli
- Shoudong Huang
- Radu Timofte
- Haijiang Zhu
- Sudipta N. Sinha
- Jue Wang
- Olivier D. Faugeras
- Atsushi Yamashita
- Yoli Shavit
- Hyun Myung
- James F. Blinn
Venues
- CoRR
- IEEE Access
- Sensors
- CVPR
- ICRA
- IROS
- ICCV
- IEEE Robotics Autom. Lett.
- Remote. Sens.
- Pattern Recognit.
- SIROCCO
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- Pattern Recognit. Lett.
- AAAI
- IEEE Trans. Instrum. Meas.
- 3DV
- Discret. Comput. Geom.
- ISPRS Int. J. Geo Inf.
- ICASSP
- Neurocomputing
- ACM Multimedia
- ICME
- BMVC
- J. Electronic Imaging
- 3DPVT
- WACV
- Image Vis. Comput.
- ITSC
- Comput. Vis. Image Underst.
- CVPR (1)
- Multim. Tools Appl.
- Trans. GIS
- MVA
- VISAPP (2)
- Vis. Comput.
- IEEE Computer Graphics and Applications
- ICDAR
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