LASER BEAM
Experts
- Emiliano Schena
- Paola Saccomandi
- Daniele Tosi
- Kiyotaka Izumi
- Takeshi Tsujimura
- Carlo Massaroni
- Kazuhiro Watanabe
- Wojtek J. Bock
- Ignacio R. Matías
- Tsu-Chin Tsao
- Michiko Nishiyama
- Sergio Silvestri
- Fumihito Arai
- Lijun Xu
- Leonardo S. Mattos
- Ningfang Song
- Radek Martinek
- Fang Li
- Erik Agrell
- Norbert Hanik
- Wenzhu Huang
- Xingwei Wang
- Zhang Cao
- Koichiro Adachi
- Wentao Zhang
- Alberto Vallan
- Jan Nedoma
- Joschka zur Jacobsmühlen
- Paul R. Prucnal
- Bongsoo Lee
- Jawad A. Salehi
- Takanori Suzuki
- Stefan Kleszczynski
- Wook Jae Yoo
- Jie Huang
- Jing Jin
- Kyoung Won Jang
- Ting Wang
- Masataka Nakazawa
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- OFC
- CoRR
- IEEE Access
- ICTON
- IEEE SENSORS
- IEEE Trans. Commun.
- IEEE J. Sel. Areas Commun.
- ECOC
- EMBC
- I2MTC
- J. Sensors
- NEMS
- Remote. Sens.
- ICAIT
- IEEE Trans. Geosci. Remote. Sens.
- Microelectron. Reliab.
- IEICE Electron. Express
- IEICE Trans. Electron.
- Int. J. Autom. Technol.
- IGARSS
- IEEE Trans. Biomed. Eng.
- ICRA
- PHOTOPTICS
- IROS
- Proc. IEEE
- IEEE Commun. Mag.
- ACC
- Prod. Eng.
- J. Vis.
- IEEE J. Solid State Circuits
- OECC/PSC
- SIU
- Symmetry
- Microelectron. J.
- IEEE Robotics Autom. Lett.
- Int. J. Bifurc. Chaos
- ICC
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