FORCE FIELD
Experts
- Alexander D. MacKerell Jr.
- Mark S. Nixon
- Adam Liwo
- Wilfred F. van Gunsteren
- Anthony J. Yezzi
- Harold A. Scheraga
- Scott T. Acton
- Josiane Zerubia
- Michel Barlaud
- Jean-Philippe Thiran
- Guirong Weng
- Yiquan Wu
- Kwang Nam Choi
- Hai-Feng Chen
- Laurent D. Cohen
- Allen R. Tannenbaum
- Cezary Czaplewski
- Xavier Bresson
- Yuanquan Wang
- Stanislaw Oldziej
- Xianghua Xie
- Ian H. Jermyn
- Bin Han
- Dimitris N. Metaxas
- Ahmad A. Masoud
- Philippe H. Hünenberger
- Chunming Li
- John N. Carter
- Paul W. Fieguth
- Hao Liu
- Nassir Navab
- Farhan Akram
- Bin Fang
- Arnold T. Hagler
- Majid Mirmehdi
- Sasan Mahmoodi
- Shafiullah Soomro
- Karl N. Kirschner
- Jeremy C. Smith
Venues
- J. Comput. Chem.
- CoRR
- J. Chem. Inf. Model.
- ICRA
- ICIP
- J. Comput. Aided Mol. Des.
- IROS
- IEEE Access
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- ISBI
- CVPR
- Pattern Recognit.
- ICPR
- Multim. Tools Appl.
- Sensors
- SMC
- Medical Imaging: Image Processing
- EMBC
- Signal Process.
- J. Electronic Imaging
- BMVC
- IET Image Process.
- ACC
- ICIP (2)
- EUSIPCO
- ICCV
- Int. J. Comput. Vis.
- Expert Syst. Appl.
- Comput. Phys. Commun.
- IGARSS
- Signal Image Video Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- PLoS Comput. Biol.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Medical Imaging
- J. Comput. Phys.
- IEEE Internet Things J.
- ICIP (1)
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