FEATURE DETECTION AND DESCRIPTION
Experts
- Michael M. Bronstein
- Alexander M. Bronstein
- Afzal Godil
- Andrea Giachetti
- Benjamin Bustos
- Petros Daras
- Apostolos Axenopoulos
- Remco C. Veltkamp
- Ivan Sipiran
- Michela Spagnuolo
- Ryutarou Ohbuchi
- Paul L. Rosin
- Leonidas J. Guibas
- Maks Ovsjanikov
- Matthieu Montès
- Slimane Larabi
- Zhouhui Lian
- Nabil Aouf
- Frank B. ter Haar
- Naif Alajlan
- Daisuke Kihara
- Dirk Smeets
- Ives Rey-Otero
- Radu Horaud
- Andrei Zaharescu
- Bo Li
- Umberto Castellani
- James E. Gary
- Mauricio Delbracio
- Dirk Vandermeulen
- Florent Langenfeld
- Helin Dutagaci
- Edmond Boyer
- Roee Litman
- Yosi Keller
- Takahiko Furuya
- Paul Suetens
- Guojun Lu
- Atsushi Tatsuma
Venues
- CoRR
- 3DOR@Eurographics
- Shape Modeling International
- Image Vis. Comput.
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- ICPR
- ICIP
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACM Trans. Graph.
- Multim. Tools Appl.
- Vis. Comput.
- Pattern Recognit.
- ICMCS, Vol. 1
- SAC
- ICPR (3)
- ICME
- IET Image Process.
- Signal Process. Image Commun.
- ICASSP (3)
- ICASSP
- IEEE Access
- J. Vis. Commun. Image Represent.
- SIGIR
- IROS
- Neurocomputing
- MUSCLE
- ECCV (3)
- Int. J. Inf. Retr. Res.
- FUSION
- Int. J. Wavelets Multiresolution Inf. Process.
- ECCV (1)
- ICCV
- ICCV Workshops
- Int. J. Multim. Inf. Retr.
- IEEE International Conference on Multimedia and Expo (II)
- Comput. Graph. Forum
- CIS
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