FEATURE DETECTION AND DESCRIPTION
Experts
- Michael M. Bronstein
- Alexander M. Bronstein
- Afzal Godil
- Apostolos Axenopoulos
- Andrea Giachetti
- Benjamin Bustos
- Petros Daras
- Remco C. Veltkamp
- Ivan Sipiran
- Michela Spagnuolo
- Leonidas J. Guibas
- Paul L. Rosin
- Slimane Larabi
- Matthieu Montès
- Zhouhui Lian
- Ryutarou Ohbuchi
- Maks Ovsjanikov
- Atsushi Tatsuma
- Daisuke Kihara
- Silvia Biasotti
- Mauricio Delbracio
- Nabil Aouf
- Yijuan Lu
- Florent Langenfeld
- James E. Gary
- Ives Rey-Otero
- Rajiv Mehrotra
- Dirk Vandermeulen
- Radu Horaud
- Guojun Lu
- Frank B. ter Haar
- Masaki Aono
- Dengsheng Zhang
- Roee Litman
- Umberto Castellani
- Takahiko Furuya
- Edmond Boyer
- Bo Li
- Paul Suetens
Venues
- CoRR
- 3DOR@Eurographics
- Shape Modeling International
- Image Vis. Comput.
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- ICPR
- ICIP
- CVPR
- ACM Trans. Graph.
- Pattern Recognit.
- Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- Neurocomputing
- ICASSP
- ICPR (3)
- ICME
- IET Image Process.
- SAC
- IROS
- J. Vis. Commun. Image Represent.
- Signal Process. Image Commun.
- ICASSP (3)
- SIGIR
- IEEE Access
- ICMCS, Vol. 1
- APCC
- Adv. Multim.
- FG
- ECCV (1)
- ICIC (2)
- ICRA
- ICCCV
- NIPS
- ACM Multimedia
- ECMR
- ICONIP (4)
- LREC/COLING
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