FAULT DIAGNOSTIC
Experts
- René-Vinicio Sánchez
- Ruqiang Yan
- Mourad Elhadef
- Chuan Li
- Krishna R. Pattipati
- Xuefeng Chen
- Andrew D. Ball
- Hongxia Pan
- Mariela Cerrada
- Pabitra Mohan Khilar
- Weihua Li
- Srikanth Venkataraman
- Orestes Llanes-Santiago
- Sudhakar M. Reddy
- Fengshou Gu
- Diego Cabrera
- Yigang He
- Irith Pomeranz
- Silvio Simani
- Jong-Myon Kim
- Heng Zhang
- Steven X. Ding
- Henrik Niemann
- Ruyi Huang
- Rakesh Ranjan Swain
- Liang Gao
- Chuang Sun
- Zhongkui Zhu
- Xinyu Li
- Jian-Da Wu
- Antônio José da Silva Neto
- Xiaofei Zhang
- Israel Koren
- Jinrui Wang
- Xiaoqing Wen
- Mingzhi Pan
- Zhuyun Chen
- Seokbae Moon
- Marios M. Polycarpou
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- IEEE Trans. Ind. Electron.
- IEEE Trans. Ind. Informatics
- CoRR
- Expert Syst. Appl.
- Eng. Appl. Artif. Intell.
- Entropy
- Reliab. Eng. Syst. Saf.
- Neurocomputing
- ACC
- ECC
- J. Intell. Fuzzy Syst.
- Adv. Eng. Informatics
- IECON
- SAFEPROCESS
- CASE
- Knowl. Based Syst.
- I2MTC
- J. Intell. Manuf.
- ICPHM
- IEEE Trans. Veh. Technol.
- IEEE Trans Autom. Sci. Eng.
- Appl. Soft Comput.
- Appl. Intell.
- Autom.
- ICAC
- ICNC
- ITC
- IEEE Internet Things J.
- CDC
- VLSI Design
- J. Syst. Control. Eng.
- ETFA
- Neural Comput. Appl.
- DATE
- ICARCV
- DFT
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