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Experts
- Saralees Nadarajah
- Rachid Guerraoui
- Liudong Xing
- Enrico Zio
- Srikanth Sastry
- Gregory Levitin
- Kishor S. Trivedi
- Anthony A. Maciejewski
- Yi-Kuei Lin
- Zhenzhou Lu
- Petr Kuznetsov
- Eiji Oki
- Marco Dalai
- Francky Catthoor
- Michael G. Pecht
- Mikel Larrea
- Thomas Lange
- Shey-Huei Sheu
- Naohiro Hayashibara
- Kaushik Roy
- Michel Raynal
- Arya Mazumdar
- Kushagra Vaid
- Rui Kang
- Marco Baldi
- Giorgio Levi
- Scott M. Pike
- Frederick T. Sheldon
- Andrey Povyakalo
- Michael Beigl
- János Tapolcai
- Xin Li
- Frank P. A. Coolen
- Antonio Fernández
- Nidhal Rezg
- Rafael F. Schaefer
- Ali Mili
- Jennifer L. Welch
- Marco Bondaschi
Venues
- CoRR
- Microelectron. Reliab.
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Reliab.
- IEEE Trans. Inf. Theory
- IRPS
- Qual. Reliab. Eng. Int.
- Oper. Res.
- IEEE Access
- Eur. J. Oper. Res.
- Sensors
- ISIT
- Comput. Ind. Eng.
- Int. J. Syst. Assur. Eng. Manag.
- IEEE Trans. Computers
- ISSRE
- IEEE Trans. Commun.
- ICC
- ITC
- WSC
- DATE
- Comput. Stat. Data Anal.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Autom. Control.
- ACC
- Entropy
- Ann. Oper. Res.
- CDC
- DSN
- Oper. Res. Lett.
- IEEM
- Commun. Stat. Simul. Comput.
- ICRA
- Int. J. Syst. Sci.
- J. Comput. Appl. Math.
- HICSS
- J. Appl. Probab.
- ISCAS
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