FAILURE RATE
Experts
- Saralees Nadarajah
- Enrico Zio
- Liudong Xing
- Rachid Guerraoui
- Gregory Levitin
- Srikanth Sastry
- Anthony A. Maciejewski
- Kishor S. Trivedi
- Petr Kuznetsov
- Zhenzhou Lu
- Yi-Kuei Lin
- Eiji Oki
- Thomas Lange
- Shey-Huei Sheu
- Michel Raynal
- Francky Catthoor
- Kaushik Roy
- Michael G. Pecht
- Naohiro Hayashibara
- Marco Dalai
- Mikel Larrea
- Ali Mili
- Andreas Zeller
- Marco Bondaschi
- Jörg Henkel
- Giorgio Levi
- Rui Kang
- Chin-Chih Chang
- Sébastien Tixeuil
- Antonio Fernández
- Frederick T. Sheldon
- Kushagra Vaid
- Frank P. A. Coolen
- Marco Baldi
- Dan Alexandrescu
- Xin Li
- Arya Mazumdar
- Rafael F. Schaefer
- Jennifer L. Welch
Venues
- CoRR
- Microelectron. Reliab.
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Reliab.
- IEEE Trans. Inf. Theory
- IRPS
- Qual. Reliab. Eng. Int.
- IEEE Access
- Oper. Res.
- Eur. J. Oper. Res.
- Sensors
- ISIT
- Comput. Ind. Eng.
- Int. J. Syst. Assur. Eng. Manag.
- IEEE Trans. Computers
- ISSRE
- IEEE Trans. Commun.
- ICC
- ITC
- WSC
- DATE
- Comput. Stat. Data Anal.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Autom. Control.
- DSN
- Ann. Oper. Res.
- ACC
- CDC
- Entropy
- Oper. Res. Lett.
- IEEM
- Commun. Stat. Simul. Comput.
- J. Comput. Appl. Math.
- ICRA
- Int. J. Syst. Sci.
- HICSS
- J. Appl. Probab.
- ISCAS
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