FACIAL FEATURE TRACKING
Experts
- Feng Lu
- Andreas Bulling
- Yusuke Sugano
- Xucong Zhang
- Qiang Ji
- Yunfei Liu
- Honghai Liu
- Arantxa Villanueva
- Rafael Cabeza
- Yoichi Sato
- Mario Fritz
- Haofei Wang
- Peter M. Grant
- Bertram E. Shi
- John M. Hannah
- Dimitris N. Metaxas
- Zhaokang Chen
- Yihua Cheng
- Richard Bowden
- Eng-Jon Ong
- Cristina Palmero
- Jean-Marc Odobez
- Otmar Hilliges
- Seonwook Park
- Roberto Valenti
- Alberto Del Bimbo
- Zicheng Liu
- Yiwei Bao
- Peter Robinson
- Kenneth Alberto Funes Mora
- Hui Yu
- Ruidong Zhang
- Sonia Porta
- Sergio Escalera
- Nicu Sebe
- Ming-Ting Sun
- Zhiwei Zhu
- Mose Sakashita
- Erroll Wood
Venues
- CoRR
- ETRA
- FG
- CVPR
- CVPR Workshops
- Multim. Tools Appl.
- BMVC
- ICRA
- ICCV
- ICPR
- ACM Multimedia
- ICIP
- Pattern Recognit. Lett.
- NeuroImage
- IEEE Trans. Image Process.
- WACV
- ROBIO
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- ICASSP
- ICCV Workshops
- Neural Process. Lett.
- SMC
- ICME
- MMSP
- Sensors
- Proc. ACM Interact. Mob. Wearable Ubiquitous Technol.
- Neurocomputing
- EMBC
- MVA
- DICTA
- Signal Image Video Process.
- IEEE Signal Process. Lett.
- CHI
- IEEE Trans. Cybern.
- ICIP (1)
- Humanoids
- ICPR (1)
- Inf. Sci.
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