FACIAL ASYMMETRY
Experts
- Fumiyuki Adachi
- Marios Savvides
- Sinjini Mitra
- Johan Schoukens
- Rik Pintelon
- Liang Wang
- Rui Dinis
- Kazuki Takeda
- Maarten Steinbuch
- Hüseyin Akçay
- Mark S. Nixon
- B. V. K. Vijaya Kumar
- Tom Oomen
- Jeffrey F. Cohn
- Tetsuya Yamamoto
- Josef Pieprzyk
- Shujun Li
- Hassan Jameel Asghar
- Yanxi Liu
- Sven Behnke
- Arnold H. Buss
- Hafez Farazi
- Anil K. Jain
- Yunhe Wang
- Sheldon H. Jacobson
- Chang Xu
- Ioannis Pitas
- Walter Kellermann
- Rama Chellappa
- Marc Moonen
- Paulo Montezuma
- Sajid Saleem
- Jacob Benesty
- Önsen Toygar
- Zhu Wang
- Terence Sim
- Dacheng Tao
- Yasser Ismail
- Anastasios Tefas
Venues
- CoRR
- ICASSP
- IEEE Trans. Instrum. Meas.
- Autom.
- CDC
- Sensors
- ISCAS
- IEEE Access
- IEICE Trans. Commun.
- IEEE Trans. Autom. Control.
- Pattern Recognit.
- EUSIPCO
- IEEE Trans. Wirel. Commun.
- IEEE Trans. Signal Process.
- IEEE Commun. Lett.
- VTC Fall
- PIMRC
- VTC Spring
- IEEE Trans. Commun.
- Multim. Tools Appl.
- ICC
- EMBC
- IEEE Signal Process. Lett.
- ECC
- OFC
- ICIP
- Signal Process.
- WCNC
- WSC
- ACC
- Symmetry
- IEEE Trans. Control. Syst. Technol.
- IEEE Trans. Veh. Technol.
- Remote. Sens.
- CVPR Workshops
- INTERSPEECH
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Geosci. Remote. Sens.
- IET Commun.
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