FACIAL ASYMMETRY
Experts
- Fumiyuki Adachi
- Marios Savvides
- Sinjini Mitra
- Johan Schoukens
- Liang Wang
- Rik Pintelon
- Rui Dinis
- Kazuki Takeda
- Maarten Steinbuch
- Hüseyin Akçay
- Mark S. Nixon
- Tom Oomen
- B. V. K. Vijaya Kumar
- Hassan Jameel Asghar
- Yanxi Liu
- Josef Pieprzyk
- Jeffrey F. Cohn
- Shujun Li
- Tetsuya Yamamoto
- Sajid Saleem
- Sven Behnke
- Chang Xu
- Ioannis Pitas
- Yunhe Wang
- Paulo Montezuma
- Arnold H. Buss
- Marc Moonen
- Hafez Farazi
- Rama Chellappa
- Anil K. Jain
- Walter Kellermann
- Sheldon H. Jacobson
- Miaowen Wen
- Huaxiong Wang
- Bin Guo
- Yangsheng Xu
- Terence Sim
- Fangjiong Chen
- Andreas H. Hielscher
Venues
- CoRR
- ICASSP
- Autom.
- IEEE Trans. Instrum. Meas.
- CDC
- Sensors
- IEICE Trans. Commun.
- ISCAS
- IEEE Access
- Pattern Recognit.
- EUSIPCO
- IEEE Trans. Wirel. Commun.
- IEEE Trans. Autom. Control.
- IEEE Commun. Lett.
- IEEE Trans. Signal Process.
- VTC Fall
- PIMRC
- VTC Spring
- ICC
- EMBC
- IEEE Trans. Commun.
- Multim. Tools Appl.
- WSC
- OFC
- WCNC
- ECC
- ICIP
- Signal Process.
- ACC
- IEEE Signal Process. Lett.
- Symmetry
- IEEE Trans. Control. Syst. Technol.
- INTERSPEECH
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Veh. Technol.
- IEEE Geosci. Remote. Sens. Lett.
- CVPR Workshops
- Remote. Sens.
- IET Commun.
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