DYNAMIC RANDOM ACCESS MEMORY
Experts
- Onur Mutlu
- Koji Nii
- Toshiaki Kirihata
- Subramanian S. Iyer
- Makoto Yabuuchi
- Meng-Fan Chang
- Jörg Henkel
- Donghyuk Lee
- Masahiko Yoshimoto
- Gregory Fredeman
- Hiroshi Kawaguchi
- Jonathan Chang
- John Barth
- Hasan Hassan
- Thomas Toifl
- Vladimir Stojanovic
- Vivek Seshadri
- Yasumasa Tsukamoto
- Paul C. Parries
- Yuan Xie
- Christian Menolfi
- Hongwu Jiang
- Thomas Morf
- David T. Blaauw
- Steven J. E. Wilton
- Marcel A. Kossel
- Shanshi Huang
- Fazal Hameed
- Norbert Wehn
- Hidehiro Fujiwara
- Tadahiro Kuroda
- Shimeng Yu
- William R. Reohr
- Nam Sung Kim
- Huawei Li
- Christian Weis
- Tong Zhang
- Dennis Sylvester
- Marian Verhelst
Venues
- IEEE J. Solid State Circuits
- ISSCC
- CoRR
- CICC
- IEEE Trans. Very Large Scale Integr. Syst.
- ISCAS
- DATE
- DAC
- IBM J. Res. Dev.
- ISCA
- ESSCIRC
- IEEE Trans. Circuits Syst. II Express Briefs
- ICCD
- IEEE Micro
- ITC
- VLSI Technology and Circuits
- ASP-DAC
- VLSI Design
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Computers
- ISQED
- ISLPED
- ACM Great Lakes Symposium on VLSI
- HPCA
- IRPS
- A-SSCC
- Microprocess. Microsystems
- VLSI Circuits
- MICRO
- SoCC
- IEEE Access
- ESSDERC
- IEICE Trans. Electron.
- ICCAD
- Microelectron. J.
- VTS
- ISOCC
- MTDT
- IEICE Electron. Express
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