DEPTH DATA
Experts
- Didier Stricker
- Yo-Sung Ho
- Guido Borghi
- Christian Theobalt
- Roberto Vezzani
- Rita Cucchiara
- Junsong Yuan
- Andreas Kolb
- Luc Van Gool
- Nassir Navab
- Marjorie Skubic
- Sergio Escalera
- Joachim Hornegger
- Pietro Zanuttigh
- Honghai Liu
- Ramesh Raskar
- Reinhard Koch
- Lee V. Streeter
- Miska M. Hannuksela
- Dieter Fox
- Hideo Saito
- Ruigang Yang
- Bruno Mirbach
- Oliver Wasenmüller
- Zhaojie Ju
- Radu Horaud
- Moncef Gabbouj
- Gongfa Li
- Jean Meunier
- René Schuster
- Massimo Camplani
- Daniel Cremers
- Seungkyu Lee
- Matthias B. Hullin
- Felix Heide
- Yao Zhao
- Emanuele Frontoni
- Du Jiang
- Ayush Bhandari
Venues
- CoRR
- Sensors
- ICIP
- CVPR
- IROS
- IEEE Access
- ICRA
- Multim. Tools Appl.
- ICPR
- ROBIO
- EMBC
- ICCV
- WACV
- CVPR Workshops
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Circuits Syst. Video Technol.
- ICCV Workshops
- SMC
- VCIP
- ICASSP
- J. Vis. Commun. Image Represent.
- Remote. Sens.
- IEEE Trans. Instrum. Meas.
- 3DV
- BMVC
- ISCAS
- Pattern Recognit. Lett.
- Comput. Vis. Image Underst.
- IEEE Robotics Autom. Lett.
- ICCE
- ICME
- APSIPA
- Comput. Electron. Agric.
- FG
- Vis. Comput.
- IEEE Trans. Multim.
- Neurocomputing
- IGARSS
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