DENSE DISPARITY MAP
Experts
- Didier Stricker
- René Schuster
- Oliver Wasenmüller
- Gauthier Lafruit
- Minglun Gong
- Zhibo Rao
- Qiong Chang
- Ke Zhang
- Richard Szeliski
- Gangwei Xu
- Jiangbo Lu
- Tsutomu Maruyama
- Ramy Battrawy
- Yuchao Dai
- Kwanghoon Sohn
- Jie Li
- Yee-Hong Yang
- Yong Zhao
- Daniel Scharstein
- Christian Bailer
- Kyung-Soo Kim
- Marc Pollefeys
- Seungryong Kim
- Mohamed El Ansari
- Xin Yang
- Soohyun Kim
- Ruigang Yang
- Mingyi He
- Masaki Onishi
- Xuchong Zhang
- Jieqing Feng
- Andrew J. Davison
- Haojie Li
- Heiko Hirschmüller
- Bifa Liang
- Shahram Izadi
- Luc Van Gool
- Junda Cheng
- Zhelun Shen
Venues
- CoRR
- CVPR
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- Pattern Recognit. Lett.
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Access
- IROS
- IEEE Trans. Image Process.
- BMVC
- Signal Process. Image Commun.
- Image Vis. Comput.
- Sensors
- IET Image Process.
- Remote. Sens.
- ICRA
- ICCV
- Vis. Comput.
- Multim. Tools Appl.
- ICIP (3)
- IGARSS
- J. Electronic Imaging
- SIU
- IEEE Robotics Autom. Lett.
- J. Vis. Commun. Image Represent.
- WACV
- 3DV
- Pattern Recognit.
- IET Comput. Vis.
- J. Real Time Image Process.
- VCIP
- ITSC
- ICME
- ACCV (1)
- Microprocess. Microsystems
- ICASSP
- ISCAS
- ISVC (1)
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