DENSE DISPARITY MAP
Experts
- René Schuster
- Didier Stricker
- Oliver Wasenmüller
- Gauthier Lafruit
- Minglun Gong
- Zhibo Rao
- Jiangbo Lu
- Ramy Battrawy
- Qiong Chang
- Richard Szeliski
- Ke Zhang
- Kwanghoon Sohn
- Yuchao Dai
- Gangwei Xu
- Tsutomu Maruyama
- Yong Zhao
- Soohyun Kim
- Mohamed El Ansari
- Daniel Scharstein
- Jie Li
- Christian Bailer
- Xin Yang
- Kyung-Soo Kim
- Marc Pollefeys
- Seungryong Kim
- Yee-Hong Yang
- Yi-Hsuan Tsai
- Huei-Yung Lin
- Jieqing Feng
- Masaki Onishi
- Dongbo Min
- Xuchong Zhang
- Wenbang Yang
- Andrew J. Davison
- Mingyi He
- Hongbin Sun
- Shahram Izadi
- Liang Wang
- Chengxi Yang
Venues
- CoRR
- CVPR
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- Pattern Recognit. Lett.
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Trans. Image Process.
- IROS
- IEEE Access
- Sensors
- Signal Process. Image Commun.
- Image Vis. Comput.
- BMVC
- ICRA
- Remote. Sens.
- IET Image Process.
- Vis. Comput.
- ICCV
- ICIP (3)
- J. Electronic Imaging
- IGARSS
- Multim. Tools Appl.
- Pattern Recognit.
- J. Real Time Image Process.
- 3DV
- WACV
- IET Comput. Vis.
- IEEE Robotics Autom. Lett.
- J. Vis. Commun. Image Represent.
- SIU
- ICASSP
- VCIP
- ACCV (1)
- Microprocess. Microsystems
- ICME
- ISCAS
- ITSC
- ISVC (1)
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