DEFECT DETECTION
Experts
- Du-Ming Tsai
- Krishnendu Chakrabarty
- Haiyong Chen
- Stefan Biffl
- Adit D. Singh
- Aytül Erçil
- Bin Gao
- Rosa Rodríguez-Montañés
- Irith Pomeranz
- V. Asha
- P. Nagabhushan
- Jinhai Liu
- Aysin Ertüzün
- Chih-Yang Lin
- Chuan-Yu Chang
- Joan Figueras
- Liang Gao
- David Lo
- Nagappa U. Bhajantri
- Wei-Yao Chiu
- Stefan Wagner
- Kun Liu
- Domen Tabernik
- Fabrizio Lombardi
- Said Hamdioui
- Danijel Skocaj
- Per Runeson
- Wai Lok Woo
- Majid Mirmehdi
- Fabian Vargas
- Luigi Dilillo
- Michel Renovell
- Alberto Bosio
- Jürgen Münch
- Frank Elberzhager
- Arnaud Virazel
- Hajime Asama
- Songling Huang
- Shen Wang
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- ITC
- Microelectron. Reliab.
- Expert Syst. Appl.
- IEEE Trans. Ind. Informatics
- Eng. Appl. Artif. Intell.
- VTS
- Adv. Eng. Informatics
- IROS
- J. Intell. Manuf.
- ICRA
- Reliab. Eng. Syst. Saf.
- DFT
- Mach. Vis. Appl.
- I2MTC
- Multim. Tools Appl.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- EMBC
- Neural Comput. Appl.
- J. Electron. Test.
- Pattern Recognit.
- Neurocomputing
- Comput. Ind.
- IEEE Trans. Ind. Electron.
- CASE
- J. Electronic Imaging
- IEEE Trans. Software Eng.
- IET Image Process.
- ICSE
- CHI
- ICIP
- DATE
- ICPR
- Pattern Recognit. Lett.
- Comput. Ind. Eng.
- Empir. Softw. Eng.
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