CORNER DETECTORS
Experts
- Baojiang Zhong
- Guojun Lu
- Mohammad Awrangjeb
- Changming Sun
- Xun Sun
- Shizheng Zhang
- Meiqing Wu
- Weichuan Zhang
- Han Wang
- Farzin Mokhtarian
- Siew Kei Lam
- Dan Yang
- Azhar Quddus
- Thambipillai Srikanthan
- Muhammad Sarfraz
- Xiaohong Zhang
- Adrian F. Clark
- Nirmala Ramakrishnan
- Sheng Huang
- Dermot Kerr
- Asif Masood
- Nadia Kanwal
- Sonya A. Coleman
- Chiara Bartolozzi
- Shoaib Ehsan
- Robert M. Haralick
- Mauricio Delbracio
- Kwanghoon Sohn
- Bertrand Kerautret
- Klaus D. McDonald-Maier
- Bin Luo
- D. S. Guru
- Edward Rosten
- Vijay Laxmi
- Kai-Kuang Ma
- Ives Rey-Otero
- Riku Suomela
- R. Dinesh
- Rajiv Mehrotra
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- Image Vis. Comput.
- Multim. Tools Appl.
- ICPR
- IEEE Trans. Image Process.
- BMVC
- CVPR
- EUSIPCO
- ICIP
- ROBIO
- ICCV
- IEEE Access
- DICTA
- ICRA
- Neurocomputing
- IGARSS
- IROS
- ISVC (1)
- IEEE Signal Process. Lett.
- IET Image Process.
- IEEE Trans. Inf. Theory
- ICIP (1)
- Mach. Vis. Appl.
- CGIV
- VISAPP (1)
- TSP
- EMBC
- ICIAP
- Remote. Sens.
- IEICE Trans. Inf. Syst.
- 3DIMPVT
- CVPR Workshops
- ISCAS
- FUZZ-IEEE
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