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Experts
- Baojiang Zhong
- Guojun Lu
- Farzin Mokhtarian
- Weichuan Zhang
- Han Wang
- Mohammad Awrangjeb
- Changming Sun
- Meiqing Wu
- Xun Sun
- Shizheng Zhang
- Xiaohong Zhang
- Dan Yang
- Muhammad Sarfraz
- Adrian F. Clark
- Siew Kei Lam
- Azhar Quddus
- Thambipillai Srikanthan
- Dermot Kerr
- Sonya A. Coleman
- Robert M. Haralick
- Nadia Kanwal
- Shoaib Ehsan
- Nirmala Ramakrishnan
- Chiara Bartolozzi
- Sheng Huang
- Asif Masood
- R. Dinesh
- Olivier Rioul
- Gauthier Lafruit
- Kwanghoon Sohn
- Bhavitavya Bhadviya
- Arcot Sowmya
- Clive S. Fraser
- Francisco Sandoval Hernández
- Moncef Gabbouj
- Andrew D. J. Cross
- Srikanth Sastry
- Mauricio Delbracio
- Bin Luo
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- Sensors
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- Image Vis. Comput.
- IEEE Trans. Image Process.
- ICPR
- CVPR
- BMVC
- EUSIPCO
- ICIP
- DICTA
- IEEE Access
- ICRA
- ROBIO
- ICCV
- IEEE Signal Process. Lett.
- IROS
- ISVC (1)
- IEEE Trans. Inf. Theory
- IGARSS
- Neurocomputing
- IET Image Process.
- 3DIMPVT
- ISCAS
- VISAPP (1)
- EMBC
- CGIV
- IEICE Trans. Inf. Syst.
- Mach. Vis. Appl.
- ICIP (1)
- CVPR Workshops
- Remote. Sens.
- TSP
- ICIAP
- Microelectron. J.
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