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Experts
- Isabelle Bloch
- Jesús Angulo
- Robert M. Haralick
- Laurent Najman
- Henk J. A. M. Heijmans
- Setrag Khoshafian
- Pedro Pina
- Tatsuo Tsuji
- Harald Schöning
- Francisco Ortiz
- Cris L. Luengo Hendriks
- Marcos Eduardo Valle
- B. S. Daya Sagar
- Edward R. Dougherty
- Peter Sussner
- Alain Bretto
- Adam D. Smith
- Jamal Atif
- Serge Abiteboul
- Leonid M. Fridman
- Matthew J. Thurley
- Abdelhak M. Zoubir
- Henk M. Blanken
- Santiago Velasco-Forero
- Junior Barrera
- Jean Cousty
- Venkatesan Guruswami
- Toyohisa Kaneko
- Teo Asplund
- Richard Furuta
- Michel E. Adiba
- George P. Copeland
- Guillaume Noyel
- Kazuhiro Ogura
- Dagmar Sternad
- Robin Strand
- Jos B. T. M. Roerdink
- Wilfried Philips
- Wouter B. Teeuw
Venues
- ISMM
- CoRR
- Pattern Recognit. Lett.
- ICIP
- IEEE Trans. Image Process.
- ICASSP
- ICPR
- Signal Process.
- Data Knowl. Eng.
- Systems and Computers in Japan
- IGARSS
- J. Vis. Commun. Image Represent.
- J. Math. Imaging Vis.
- ICRA
- IEEE Trans. Geosci. Remote. Sens.
- EDBT
- Pattern Recognit.
- IEEE Trans. Signal Process.
- IEEE Access
- EUSFLAT Conf.
- VLDB
- PODS
- EUSIPCO
- DBPL
- Comput. Aided Des.
- Math. Morphol. Theory Appl.
- SIGMOD Conference
- IROS
- WILF
- CDC
- Multim. Tools Appl.
- ICDE
- IEEE Signal Process. Lett.
- ICIP (2)
- ISMM (2)
- Inf. Sci.
- IEEE Trans. Smart Grid
- IEEE Trans. Instrum. Meas.
- Image Vis. Comput.
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