ASPECT RATIO
Experts
- Sang Won Bae
- Guanghui Wang
- Zhanyi Hu
- Nan Sun
- Zuzana Kukelova
- Ching-Nung Yang
- Tomás Pajdla
- Jovisa D. Zunic
- Michael T. Goodrich
- Nutan Limaye
- Csaba D. Tóth
- Yuanjin Zheng
- Liter Siek
- Kareem Ragab
- Kevin W. Bowyer
- Bettina Speckmann
- Yasuaki Kakehi
- Lei Qiu
- Hongbin Zha
- Kenichi Kanatani
- Jeonggoo Song
- Adrien Bartoli
- Alberto Alzati
- Alejandro F. Frangi
- Martin Bujnak
- Toshihiko Yamasaki
- Adrian Dumitrescu
- Peter F. Sturm
- Takeshi Shakunaga
- Xiyuan Tang
- Fumihiro Inoue
- Priya Ranjan Sinha Mahapatra
- Rui Paulo Martins
- Robert J. Woodham
- Vincent van der Weele
- Xueting Wang
- Kiyomi Nakamura
- Andreas Krebs
- Kalle Åström
Venues
- CoRR
- CVPR
- Remote. Sens.
- Pattern Recognit.
- Sensors
- Pattern Recognit. Lett.
- IEEE Access
- ICCV
- IEEE Trans. Instrum. Meas.
- IROS
- ICIP
- Discret. Math.
- NEMS
- IEEE Geosci. Remote. Sens. Lett.
- IGARSS
- ICPR
- ICASSP
- NeuroImage
- J. Comb. Theory, Ser. A
- ISCAS
- ICRA
- Multim. Tools Appl.
- Comput. Vis. Image Underst.
- Microelectron. J.
- Vis. Comput.
- Electron. Notes Discret. Math.
- Inf. Process. Lett.
- Appl. Math. Comput.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE J. Solid State Circuits
- J. Comput. Phys.
- Int. J. Comput. Vis.
- 3DIC
- Comput. Chem. Eng.
- ISSCC
- IEEE Trans. Pattern Anal. Mach. Intell.
- Discret. Appl. Math.
- CHI
- Expert Syst. Appl.
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