ASPECT GRAPH
Experts
- Kevin W. Bowyer
- Ziv Gigus
- Jean Ponce
- Jianzhuang Liu
- Jitendra Malik
- François X. Sillion
- David W. Eggert
- Kok Cheong Wong
- Jean-Yves Ramel
- Henrik I. Christensen
- P. Y. Mok
- Bernard F. Buxton
- Attawith Sudsang
- Hiroshi Nagamochi
- Xiaoou Tang
- David William Murray
- Charles R. Dyer
- Seok-Hee Hong
- David A. Castelow
- Yu Cao
- Katsushi Ikeuchi
- Josef Kittler
- Martin C. Cooper
- Subhash Suri
- Benjamin B. Kimia
- Steve Sullivan
- Seungyong Lee
- Tao Luo
- Richard E. Parent
- Stéphane Grabli
- Utpal Roy
- Frédo Durand
- Gen-ichiro Kinoshita
- Eiichi Mutoh
- Kazuo Tanie
- John F. Canny
- Jean-Pierre Merlet
- Hongbin Zha
- Pascal Barla
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- Int. J. Comput. Vis.
- CoRR
- CVPR
- Comput. Aided Des.
- Pattern Recognit.
- ICCV
- Pattern Recognit. Lett.
- ICPR
- Artif. Intell.
- IROS
- SIGGRAPH
- Vis. Comput.
- Image Vis. Comput.
- Rendering Techniques
- Comput. Graph. Forum
- ICME
- SMC
- Int. J. Robotics Res.
- Scale-Space
- BMVC
- MVA
- ACM Comput. Surv.
- Comput. Geom.
- Graph Drawing
- IEEE Trans. Robotics Autom.
- Int. J. Pattern Recognit. Artif. Intell.
- ICRA (2)
- NPAR
- EUROMICRO
- Sci. China Inf. Sci.
- J. Multivar. Anal.
- IEEE Trans. Vis. Comput. Graph.
- Theor. Comput. Sci.
- J. Comput. Appl. Math.
- IACR Cryptol. ePrint Arch.
- IEEE Trans. Knowl. Data Eng.
- ICAC
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