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Experts
- Roberto Cipolla
- Levente Hajder
- Peter J. Giblin
- Fatih Ulupinar
- Jun Sato
- Richard S. Weiss
- Ákos Pernek
- Csaba Kazó
- Kalle Åström
- Andrew Zisserman
- Joshua Zahl
- Kostas Daniilidis
- János Pach
- Ramakant Nevatia
- Akimasa Otsuka
- James Z. Wang
- Rui Song
- Alec Jacobson
- Chin-Seng Chua
- Jianbo Ye
- Vincent Lévesque
- Michael A. Steinberg
- Michael Werman
- Xuchong Qiu
- Andrew Suk
- Satoshi Miura
- Darren Engwirda
- Jörg Peters
- Matthias Ochs
- Eitan Grinspun
- Mathieu Aubry
- Ludvig af Klinteberg
- Nicholas R. Gans
- Thomas S. Huang
- David Ivers
- Pierre-Alain Langlois
- Pere Brunet
- Victor Parque
- Yuanxin Wu
Venues
- CoRR
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
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- Vis. Comput.
- BMVC
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- Comput. Graph.
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- WACV
- ICASSP
- SIGGRAPH
- ICINCO (2)
- IEEE Computer Graphics and Applications
- CISP-BMEI
- Appl. Math. Lett.
- Adv. Intell. Syst.
- SIAM J. Appl. Dyn. Syst.
- Pattern Recognit.
- EMEIT
- Multiscale Model. Simul.
- ICIRA (2)
- IROS
- ACM Trans. Graph.
- CHI
- Int. J. Bifurc. Chaos
- Remote. Sens.
- ICPR (1)
- Mach. Vis. Appl.
- Comput. Methods Programs Biomed.
- IEEE Access
- IEICE Trans. Electron.
- Artif. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Comput. Appl. Technol.
- SMI
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