An analysis of the delay defect detection capability of the ECR test method.
Seonki KimSreejit ChakravartyBapiraju VinnakotaPublished in: ITC (2000)
Keyphrases
- preprocessing
- significant improvement
- high precision
- computationally efficient
- computational cost
- prior knowledge
- experimental evaluation
- defect detection
- optimization method
- classification method
- synthetic data
- statistical analysis
- probabilistic model
- cost function
- objective function
- data analysis
- computational complexity
- support vector machine
- high accuracy
- video sequences
- detection method
- multiscale
- similarity measure
- test data
- decision trees
- fully automatic
- neural network
- data sets