Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales.
Mojtaba EbrahimiAdrian EvansMehdi Baradaran TahooriRazi SeyyediEnrico CostenaroDan AlexandrescuPublished in: DATE (2014)
Keyphrases
- comprehensive analysis
- embedded processors
- error detection
- single chip
- high speed
- parallel processing
- dynamic random access memory
- embedded systems
- watermarking algorithm
- error accumulation
- mac protocol
- error analysis
- database
- parallel computing
- error correction
- industry standard
- prediction error
- digital images
- errors occur
- real time