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Sequential Fault Modeling and Test Pattern Generation for CMOS Iterative Logic Arrays.
Mihalis Psarakis
Dimitris Gizopoulos
Antonis M. Paschalis
Yervant Zorian
Published in:
IEEE Trans. Computers (2000)
Keyphrases
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delay insensitive
low cost
neural network
focal plane
fault detection
real time
artificial intelligence
image processing
hidden markov models
high speed
infrared
automated reasoning
image sensor
digital circuits