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Wafer-level test system using a physical stimulus for a MEMS accelerometer.

Yaqiong ChenZhenhai ZhangYantao ShenKejie Li
Published in: RCAR (2017)
Keyphrases
  • higher level
  • activity recognition
  • levels of abstraction
  • machine learning
  • clustering algorithm
  • case study
  • evolutionary algorithm
  • virtual world
  • test cases
  • physical world