T2: Statistical Methods for VLSI Test and Burn-in Optimization.
Adit D. SinghPublished in: Asian Test Symposium (2005)
Keyphrases
- statistical methods
- statistical tests
- statistical analysis
- computational methods
- biological data
- machine learning
- statistical approaches
- optimization algorithm
- probability density function
- machine learning methods
- optimization method
- risk factors
- statistical models
- statistical analyses
- optimization process
- optimization problems
- test data
- data mining techniques
- statistical model
- signal processing
- computer vision