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Permanent and Transient Effects of High-Temperature Bias Stress on Room- Temperature $V_{T}$ Drift Measurements in SiC Power MOSFETs.

Daniel B. HabersatRonald GreenAivars J. Lelis
Published in: IRPS (2019)
Keyphrases
  • high temperature
  • room temperature
  • composite materials
  • thermal conductivity
  • steady state
  • power consumption
  • rough sets
  • magnetic field
  • thin film
  • diesel engine
  • data sets
  • neural network
  • measurement error