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A Low Area On-chip Delay Measurement System Using Embedded Delay Measurement Circuit.

Kentaroh KatohKazuteru NambaHideo Ito
Published in: Asian Test Symposium (2010)
Keyphrases
  • power dissipation
  • high speed
  • phase locked loop
  • power consumption
  • low cost
  • low power
  • circuit design
  • evolvable hardware
  • chip design
  • database
  • data sets
  • evolutionary algorithm
  • input output
  • critical path