A Detection Approach for Wafer Detect in Industrial Manufacturing based on YOLOv8.
Qian TaoYiyang ChenHongtian ChenPublished in: SAFEPROCESS (2023)
Keyphrases
- detection method
- detection algorithm
- automatic detection
- semiconductor manufacturing
- automated detection
- robust detection
- automatically detecting
- manufacturing process
- detection accuracy
- manufacturing industry
- abnormal behavior
- detection mechanism
- false positives
- manufacturing systems
- industrial applications
- detection rate
- detect anomalies
- reliable detection
- face detection
- object detection
- quality control
- manufacturing enterprises
- detecting anomalous
- neural network
- wafer fabrication
- road signs
- change detection
- object recognition
- decision making
- genetic algorithm